Xiong X., Qiao Y., Knoll A., Lenseth K., Selvamanickam V., Chen Y., Hazelton D., Rar A., Schmidt R., Gogia B., Marchevsky M., Xie Y.-.
Ключевые слова: presentation, HTS, coated conductors, pilot-scale, fabrication, cables three-in-one, grid operation, YBCO, REBCO, MOCVD process, doping effect, critical current, angular dependence, defects columnar, coils, joints, anisotropy, current-voltage characteristics, economic analysis, power equipment, critical caracteristics, status
Xiong X., Qiao Y., Knoll A., Lenseth K., Selvamanickam V., Chen Y., Hazelton D., Weber C., Rar A., Schmidt R., Gogia B., Marchevsky M., Xie Y.-.
Ключевые слова: presentation, HTS, coated conductors, seed layers, magnetron sputtering, buffer layers, fabrication, high rate process, IBAD process, homogeneity, texture, long conductors
Xiong X., Qiao Y., Xie Y., Knoll A., Lenseth K., Selvamanickam V., Chen Y., Hazelton D., Rar A., Schmidt R., Marchevsky M.
Xiong X., Qiao Y., Knoll A., Selvamanickam V., Xie Y.Y., Chen Y., Weber C.S., Lenseth K.P., Schmidt R.M., Rar A., Marchevsky M.
Ключевые слова: HTS, coated conductors, IBAD process, buffer layers, high rate process, long conductors, pilot-scale, fabrication, length, quality control
Xiong X., Qiao Y., Xie Y., Knoll A., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R., Gogia B., Marchevsky M., Pethuraja G., Dutta P.
Xiong X., Xie Y., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R., Martchevskii M., Herrin J.
Xiong X., Xie Y., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R., Martchevskii M., Herrin J.
Xiong X., Xie Y., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R., Martchevskii M., Herrin J.
Ключевые слова: presentation, HTS, coated conductors, YBCO, cables three-in-one, current-voltage characteristics, ac losses, coils insert, design parameters, critical current, MOCVD process, thickness dependence, hot spots, high rate process, texture, power equipment, critical caracteristics, fabrication
Xiong X., Qiao Y., Reeves J., Xie Y., Lenseth K., Selvamanickam V., Zhang X., Rar A., Schmidt R., Martchevskii M., Chen P.Y., Herrin D.H.
Ключевые слова: presentation, HTS, coated conductors, critical current, thickness dependence, MOCVD process, high rate process, long conductors, homogeneity, texture, cables three-in-one, current-voltage characteristics, ac losses, coils insert, magnets, review, YBCO, design parameters, power equipment, critical caracteristics, fabrication
Ключевые слова: presentation, HTS, coated conductors, YBCO, long conductors, MOCVD process, critical current, thickness dependence, current-voltage characteristics, measurement technique, control systems, composition, texture, microstructure, high rate process, homogeneity, review, critical caracteristics, fabrication, length
Xiong X., Qiao Y., Selvamanickam V., Xie Y.Y., Hazelton D.W., Reeves J.L., Chen Y., Zhang X., Tekletsadik K., Lenseth K.P., Schmidt R.M., Rar A.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, MOCVD process, long conductors, coils pancake, FCL resistive, review, power equipment, fabrication
Li Y., Xiong X., Qiao Y., Selvamanickam V., Reeves J.L., Chen Y., Xie Y.-Y., Lenseth K.P., Schmidt R.M., Rar A.
Ключевые слова: HTS, YBCO, coated conductors, long conductors, IBAD process, buffer layers, films epitaxial, high rate process, fabrication, length
Xiong X., Qiao Y., Reeves J., Xie Y., Lenseth K., Selvamanickam V., Chen Y., Zhang X., Rar A., Schmidt R.
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